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SURAGUS EddyCus? TF map 2525


Eddy-Cus TF map 2525

Non-contact sheet resistance mapping

The Eddy-Cus TF map 2525SR auto-mat-ic-ally meas-ures the sheet res-ist-ance of large samples up to 250 x 250 mm2 (10 x 10 inches) in non-con-tact mode. Upon manu-al sample po-s-i-tion-ing the device auto-mat-ic-ally meas-ures and dis-plays an ac-cur-ate map-ping of the sheet res-ist-ance across the en-tire sample area. The meas-ure-ment set-tings al-low eas-ily and flex-ibly to choose between fast meas-ure-ment times of be-low 1 minute or high spa-tial meas-ure-ment res-ol-u-tion of more than 100,000 meas-ure-ment points.

Advantages

Non-contact real time measurement of substrates up to 250 x 250 m2 (10 x 10 inches)
High resolution mapping of conductive thin films
Characterization even of hidden and encapsulated conductive layers
Various software-integrated analysis functions (e.g. sheet resistance distribution, line scans, single point analysis)
Measurement data saving and export functions

Measurement characteristics

Sheet resistance
Thin layer uniformity control
Defect detection and coating analysis
Measurement and mapping of metal layer thickness
Quality control, input and output control
Sample sizes: 50 x 50 mm2 to 250 x 250 mm2 (2 x 2 inches to 10 x 10 inches)
Measurement range: 0.001 to 1,000 Ohm/sq

Applications

Coated architectural glass, e.g. LowE
Displays, touch screens and flat panel displays
OLED and LED applications
Smart glass
Graphene layers
Photovoltaic wafers and cells
Semiconductor wafers
Metallization layers and wafer metallization
De-icing and heating applications
Battery electrodes
Conductively coated paper and conductive textiles

Software and device control

Very user-friendly software
Real-time mapping measurement
Easy-to-use statistical analysis options
Various data analysis, data saving and export options